G. Abadal received his degree in physics in 1991 and his PhD in electrical engineering in 1997 from the Universitat Autònoma de Barcelona. During his thesis, he has been working with Scanning Tunneling Microscopy operating in air (STM) and in an electrochemical environment (ESTM) and also with Atomic Force Microscopy (AFM) and their application on the early stage of pioneering works on local nano-anodization of silicon surfaces. In 1998, he started to apply nano-anodization of aluminum surfaces as a nanolithography technique for the fabrication of nano-electromechanical systems (NEMS) for ultrasensitive mass sensing applications. His actual research interests is focused in the area of micro and nanoelectromechanical systems (MEMS and NEMS) for sensor, RF communications and energy harvesting applications, and their integration using CMOS standard technologies. Since 2002 he is an associate professor in the Electronics Engineering Department of the Universitat Autonoma de Barcelona.